Coblenz Society Challenge
The Coblentz Society, an affiliate of the Society of Applied Spectroscopy, was approached with a challenge from an anonymous donor during the SciX13 conference.
The Coblentz Society, an affiliate of the Society of Applied Spectroscopy, was approached with a challenge from an anonymous donor during the SciX13 conference. If donations toward the Lippincott endowment fund total $5,000, the anonymous donor will match the $5,000.
The endowment is underfunded and not able to sustain the award going forward. Subsequent to the conference, the anonymous donor agreed to extend the challenge through 2013. To donate, visit the donation link on the Coblentz: http://members.coblentz.org/donations.
The Ellis R. Lippincott Award is presented annually to an outstanding vibrational spectroscopist. It is co-sponsored by the Coblentz Society, the Society for Applied Spectroscopy, and the Optical Society of America. The award is presented in memory of Professor Ellis R. Lippincott to scientists who have made significant contributions to vibrational spectroscopy as judged by their influence on other scientists.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Achieving Accurate IR Spectra On Monolayer of Molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
