Correlative Raman Imaging of Semiconducting Materials
See 2D/3D Raman, AFM, SEM, and SHG/THG microscopy measurements of GaN, Si, and MoS2 for characterizing composition, crystallinity, topography, and stress fields.
Single Cell and Microplastic Analysis by ICP-MS with Automated Micro-Flow Sample Introduction
April 25th 2024Single cell ICP-MS (scICP-MS) is increasingly seen as a powerful and fast tool for the measurement of elements in individual cells, mainly due to the high sensitivity and selectivity of ICP-MS. Analysis is performed in the same way as single nanoparticle (spICP-MS) analysis, which has become a well-established technique for the analysis of nanoparticles and particles.
Hot News on Agilent LDIR, New Developments, and Future Perspective
April 25th 2024Watch this video featuring Darren Robey and Dr. Wesam Alwan from Agilent Technologies to gain insights into the future trends shaping microplastics research and the challenges of their characterization. Discover the essential components necessary for accurate microplastics analysis and learn how the Agilent 8700 LDIR system addresses these challenges. Offering rapid and precise analysis capabilities, along with easy sample preparation methods that minimize contamination, the Agilent 8700 LDIR system is at the forefront of advancing microplastics research.
The World of Microplastics Up to Date – an Overview
April 23rd 2024Watch this 20-minute educational video by Andreas Kerstan, Agilent Product Specialist in molecular spectroscopy, to gain a comprehensive update on the microplastics landscape and the environmental concerns related to them. Discover the current challenges in microplastics characterization and how Agilent innovative solutions and techniques, including FTIR, LDIR, GC/MS, and ICP-MS, are addressing these issues head-on.
