Damage-Free Failure/Defect Analysis in Electronics and Semiconductor Industries Using Micro ATR FT-IR Imaging

April 22, 2015

Fourier Transform Infrared Spectroscopy (FTIR) is a non-destructive analytical technique that helps identify and monitor the chemical makeup of almost any material. Using the Agilent Cary 620 chemical imaging system damage-free failure/defect analysis in electronics and semiconductor industries using micro ATR FTIR imaging can be performed.