Article

Spectroscopy

Damage-Free Failure/Defect Analysis in Electronics and Semiconductor Industries Using Micro ATR FT-IR Imaging

Author(s):

Dr. Mustafa Kansiz,Dr. Kevin Grant

Fourier Transform Infrared Spectroscopy (FTIR) is a non-destructive analytical technique that helps identify and monitor the chemical makeup of almost any material. Using the Agilent Cary 620 chemical imaging system damage-free failure/defect analysis in electronics and semiconductor industries using micro ATR FTIR imaging can be performed.

 

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