Researchers at the National Institute of Standards and Technology (NIST) have developed and issued for sale a new test material for calibrating quality control equipment used extensively by the polymer industry.
Researchers at the National Institute of Standards and Technology (NIST) have developed and issued for sale a new test material for calibrating quality control equipment used extensively by the polymer industry. The product of a five-year effort that also produced significant improvements in mass spectrometry techniques for analyzing polymers, the new NIST reference material is the first to offer manufacturers a test sample with a known—and verified—distribution of molecular masses.
The new material, NIST Standard Reference Material (SRM) 2881, “Polystyrene Absolute Molecular Mass Distribution Standard,” provides the absolute molecular masses of 43 different lengths of polystyrene molecules and their cumulative contribution to the total mass of the sample from 1 to 99 percent. Developing the new SRM, according to project leader William Wallace, involved a long process of analyzing and optimizing all aspects of the sample preparation, an international comparison of results from different laboratories, and developing improved tools for measuring individual molecular masses using matrix assisted laser desorption-ionization time-of-flight mass spectrometry (MALDI-TOF).
The NIST reference material is polystyrene, and it can be used to calibrate mass distribution measurements for a broad range of polymers.
AI and Satellite Spectroscopy Team Up to Monitor Urban River Pollution in China
April 30th 2025A study from Chinese researchers demonstrates how combining satellite imagery, land use data, and machine learning can improve pollution monitoring in fast-changing urban rivers. The study focuses on non-optically active pollutants in the Weihe River Basin and showcases promising results for remote, data-driven water quality assessments.
New Optical Modeling Method Advances Thin Film Analysis Using Spectroscopic Ellipsometry
April 30th 2025Researchers at Zhejiang University have developed an advanced optical modeling approach using spectroscopic ellipsometry, significantly enhancing the non-destructive analysis of amorphous silicon oxide thin films.