Products
Product Resources
FT-IR OEM spectrometer
FT-IR OEM spectrometer
The Monolith 20 FT-IR OEM spectrometer from FTRX is designed for easy interfacing to sampling systems and flexible integration into dedicated analyzers. According to the company, the spectrometer utilizes a fixed monolithic structure and an interferometer that is permanently stable and maintains accuracy and stability in harsh environments.
FTRX, LLC, Deer Park, NY;
Handheld Raman spectrometer
B&W Tek's NanoRam handheld Raman spectrometer is designed with an embedded 2D barcode scanner, batch scanning capabilities, an IP-64 rated (dust tight and splash proof) housing, Ethernet connectivity, and other software enhancements. According to the company, two sampling accessories for the spectrometer have also been introduced, a 12-in. immersion shaft and a tablet holder.
B&W Tek, Newark, DE;
www.bwtek.com/products/nanoram
Fluorescence mercury analyzer
The FMA-80 fluorescence mercury analyzer from Milestone is designed for the simultaneous atomic fluorescence and atomic absorption measurements of water-based samples and matrix digestates for mercury analysis. According to the company, there is no need for sample dilution.
Milestone, Inc., Shelton, CT;
Controlled substance reference database
PANalytical's CanDI-X controlled substance reference database for X-ray diffraction reportedly contains more than 500 traceable reference patterns for most hard narcotics, street and prescription drugs, precursors, excipients, and common steroids. According to the company, the database allows nondestructive identification of complex mixtures and identification of narcotics incorporated into creams and petroleum jellies.
PANalytical, Westborough, MA;
X-ray windows
Amptek's C series low-energy X-ray windows for X-ray fluorescence applications are made of silicon nitride with aluminum coating and are designed to extend the low energy response of the company's silicon drift detector down to carbon. According to the company, the windows provide an alternative to beryllium windows.
Amptek, Inc., Bedford, MA;
Air monitoring system
The Open Path air monitoring system from Bruker is designed for ambient air monitoring in industrial, urban, and rural environments. According to the company, the FT-IR-based system sends a modulated infrared beam from the base unit to a reflector at a typical distance of 50–250 m, and the light returning from the reflector is analyzed for the presence of the gases of interest.
Bruker Optics, Billerica, MA;
UV–vis–NIR spectrophotometer analyzers
The Moxtek Proflux UVD260 and UVD240 analyzers are designed to improve UV–vis–NIR spectrophotometer performance. According to the company, the analyzers cover wavelength ranges from 240 nm to 3.3 µm and have no infrared leakage issues.
Moxtek, Orem, UT;
Photoacoustic accessories
The PA301 photoacoustic accessory by Gasera and offered by PIKE Technologies is designed as a multipurpose analyzer for solids and liquids. The PA101 is a dedicated gas analyzer. The analyzers have a cantilever pressure sensor that is reportedly more than 100 times more sensitive than the membranes used in conventional photoacoustic spectroscopy designs.
PIKE Technologies, Madison, WI;
NMR spectrometer
The Thermo Scientific picoSpin 45 Proton NMR spectrometer is designed as a benchtop device that processes liquid samples as small as 30 µL. According to the company, the spectrometer weighs less than 5 kg, can be shared by multiple laboratories, and has a fluid capillary cartridge that allows liquids to be injected without the need to use NMR tubes.
Thermo Fisher Scientific, San Jose, CA;
Mass spectrometer
The LCMS-8040 triple-quadrupole mass spectrometer from Shimadzu is designed to provide polarity switching at 15 ms and a high speed-scanning rate of 15,000 u/s. According to the company, the instrument's UFsweeper II collision cell design enables MRM transition speeds of up to 5555 MRM/s.
Shimadzu Scientific Instruments, Inc., Columbia, MD;
Photovoltaic measurement system
Newport Corporation's Oriel IQE-200 photovoltaic cell measurement system is designed for simultaneous measurement of the external and internal quantum efficiency of solar cells, detectors, and other photon-to-charge converting devices. The system reportedly splits the beam to allow for concurrent measurements. The system includes a light source, a monochromator, and related electronics and software. According to the company, the system can be used for the measurement of silicon-based cells, amorphous and mono/poly crystalline, thin-film cells, copper indium gallium diselenide, and cadmium telluride.
Newport Corporation, Irvine, CA;
PAT microsite
A microsite from Hellma is designed to provide PAT users with comprehensive information on the topic. According to the company, site visitors can build a ready-to-order optical immersion probe with its on-line configurator.
Hellma USA, Inc., Plainview, NY;
Mercury analyzers
The Hydra II mercury analyzers from Teledyne Leeman Labs are designed to provide configuration flexibility. According to the company, the analyzers can be configured to conduct the analysis of liquids by sample digestion followed by cold vapor atomic absorption or cold vapor atomic fluorescence, and the direct analysis of solid or semisolid sample matrices through thermal decomposition followed by cold vapor atomic absorption.
Teledyne Leeman Labs, Hudson, NH;
Raman spectrometer
The LabRAM HR Evolution spectrometer from Horiba Scientific is designed with an automated, extended wavelength range capability. According to the company, the product's wavelength range is from 200 nm to 2000 nm, with access to frequencies as low as 10 cm-1 .
Horiba Scientific, Edison, NJ;
Raman microscope
Renishaw's inVia Raman microscope is designed with a 3D imaging capability that allows users to collect and display Raman data from within transparent materials. According to the company, the instrument's StreamLineHR feature collects data from a series of planes within materials, processes it, and displays it as 3D volume images representing quantities such as band intensity.
Renishaw, Hoffman Estates, IL;
Raman analyzers
The ProRaman-L series Raman spectrometers from Enwave Optronics are designed to provide measurement capability down to low parts-per-million levels. According to the company, the instruments are suitable for process analytical method developments and other measurements requiring high sensitivity and high speed analysis.
Enwave Optronics, Inc., Irvine, CA;
Detection system
The CBEx chemical, biological, and explosive identification system from Snowy Range Instruments is designed to overcome issues associated with current handheld systems that may struggle with pellets, prills, or the interpretation of mixtures. According to the company, the system reduces analysis time and displays the results on a glove-compatible OLED resistive touch screen.
Snowy Range Instruments, Laramie, Wyoming;
ATR and specular reflection accessory
The VeeMAX III variable angle FT-IR accessory from PIKE Technologies is reportedly available in specular reflection and ATR configurations that cover incidence ranges from 30° to 75°. According to the company, single-reflection ZnSe, ZnS, Ge, and Si crystal plates are offered for ATR applications, and all can be equipped with an optional electrochemical cell.
PIKE Technologies, Madison, WI;
Inorganic certified reference materials
SPEX CertiPrep's Inorganic certified reference materials are available for ICP, ICP–MS, IC, AA, and XRF analysis for a range of analytical applications. According to the company, products include certified pH buffers, USP 232 standards, and 1-ppm ICP–MS single element standards.
SPEX CertiPrep, Metuchen, NJ;
Voltage converter
EMCO's ultraminiature DC to HV DC converter is designed as a surface mount device that occupies <0.10 in.3 of space and has a profile of 0.128 in. above the host circuit board. According to the company, output voltages range from 100 V to 6 kV.
EMCO High Voltage Corp., Sutter Creek, CA;
Wafer checker
Harrick's double transmission wafer checker is designed for infrared measurements to detect low-level impurities or oxygen content in the silicon wafers used in the electronics, telecommunications, and solar panel industries. According to the company, the accessory can be used to analyze wafers with diameters up to 6 in. and thicknesses up to 3 mm.
Harrick Scientific Products, Inc., Pleasantville, NY;
EMCCD spectroscopy detector
The Andor Newton EMCCD spectroscopy detector is designed with low noise electronics, cooling to -100 °C, up to 95% peak quantum efficiency, multi-MHz readout, USB 2.0 connectivity, and versatile readout modes. According to the company, the detector uses its electron multiplying CCD platform with optimized sensor formats for ultralow light level spectroscopy applications.
Andor Technology, South Windsor, CT;
Mercury analyzer
The RA-4500 mercury analyzer from Nippon Instruments is designed to fully automate the sample digestion and analysis for mercury in wasterwaters, drinking water, and other aqueous samples. According to the company, features include NIST-traceable temperature logging, a color sensor for potassium permanganate verification, and a built-in exhaust system.
Nippon Instruments North America, College Station, TX;
Triple-quadrupole ICP-MS system
The model 8800 ICP-QQQ triple-quadrupole ICP-MS system from Agilent Technologies is designed to provide superior performance, sensitivity, and flexibility compared with single-quadrupole ICP-MS systems. According to the company, the system's ORS3 collision–reaction cell provides precise control of reaction processes for MS-MS operation. The system is intended for use in semiconductor manufacturing, advanced materials analysis, clinical and life-science research, and other applications in which interferences can hamper measurements with single-quadrupole ICP-MS.
Agilent Technologies, Santa Clara, CA;
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
