Additional information from the NMR section of the Pittcon Review article.
Manufacturer: Magritek
Product name: Spinsolve
Compact NMR Spectrometer
New this year: Newly introduced at Pittcon 2013
Used for: Lab, process analysis
Measurement Mode: NMR
Special Features: Fits on a lab benchtop. Uses standard 5mm NMR tubes. Excellent spectral resolution; uses an external lock so that any solvent can be used. The Spinsolve NMR spectrometer is the fastest compact NMR spectrometer on the market today. The instrument has the highest resolution and highest sensitivity of any compact NMR spectrometer.
Software: Proprietary Magritek operating software
Compatible with standard 5mm NMR tubes
Suggested applications: Chemistry teaching labs, small molecule bench chemistry, process control
Primary benefits: Compact benchtop NMR spectrometers provide the convenience of immediate NMR measurement, with the highest sensitivity of any compact NMR spectrometer. The Spinsolve compact NMR spectrometer has the best spectral resolution in this class of NMR spectrometer enabling improved identification of components. Unique features worthy of mention: >10:1 sensitivity on 0.1% ethyl benzene, < 1Hz spectral resolution (@ 50% level), No cryogens needed
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.