Reflectivity Measurement with an Integrating Sphere

Raman microscopy supports polymer research by characterizing raw materials, monitoring polymerization, analyzing crystallization, and ensuring quality and traceability.

Our GoldenEye is the only Snapshot hyperspectral imager covering from 400-1100nm.

XperRAM S combined with a phase shifting interferometer is capable of analyzing the surface structure of nanomaterials such as graphene, 2D materials, and TMD.

By adding a FLIM module to the inVia Raman microscope, you can directly correlate Raman and fluorescence lifetime images with ease.

This work describes Raman and IR spectroscopies as a viable means of comparing CO2 concentrations.

In this application note, we use a compact, high-resolution spectrometer to investigate the reflectance properties of graphite samples in powder form.