Richard P. Van Duyne Receives Gold Medal Award from the New York Society for Applied Spectroscopy
The 2017 New York Society for Applied Spectroscopy Gold Medal Award was presented to Richard P. Van Duyne at the Eastern Analytical Symposium and Exposition in Plainsboro, New Jersey on October 13.
The 2017 New York Society for Applied Spectroscopy Gold Medal Award was presented to Richard P. Van Duyne at the Eastern Analytical Symposium and Exposition in Plainsboro, New Jersey on November 13. The award, established in 1952, recognizes outstanding contributions to the field of Applied Spectroscopy.
Van Duyne, a professor at Northwestern University, is best known for discovering surface-enhanced Raman spectroscopy (SERS), inventing nanosphere lithography, and developing ultrasensitive nanosensors based on localized surface plasmon resonance (LSPR) spectroscopy. Among his ongoing research interests are SERS, LSPR spectroscopy, plasmonics, nanoscale biosensors, atomic layer deposition, ultrahigh vacuum tip-enhanced Raman spectroscopy (UHV-TERS), electrochemical tip-enhanced Raman spectroscopy (EC-TERS), and surface-enhanced femtosecond stimulated Raman spectroscopy (SE-FSRS). He has published more than 375 papers and has an h-index of 96.
He has been recognized for his accomplishments with the Spiers Memorial Award, Royal Society of Chemistry, Faraday Division (2017); election to the American Institute of Medical and Biological Engineers (2016); the Theophilus Redwood Award, Royal Society of Chemistry (2015); the E. Bright Wilson Award in Spectroscopy, American Chemical Society (2014); the Thomson Reuters List of Highly Cited Researchers (2014, 2015, 2016); the Charles Mann Award in Applied Raman Spectroscopy, Society of Applied Spectroscopy (2014); the Sir George Stokes Award, Royal Society of Chemistry (2013); Thomson Reuters list of top 100 chemists over the period 2000-2010 as ranked by the impact of their published research (2011); Charles N. Reilley Award, Society for Electroanalytical Chemistry (2011); election to the US National Academy of Sciences (2010); Analytical Chemistry Award, American Chemical Society, (2010); Bomem-Michelson Award, Coblentz Society (2010); Ellis R. Lippincott Award, Optical Society of America (2008); L’Oreal Art and Science of Color Prize (2006); Nobel Laureate Signature Award for Graduate Education, American Chemical Society (2005); Election to the American Academy of Arts and Sciences (2004); The Earle K. Plyler Prize for Molecular Spectroscopy, American Physical Society (2004); Excellence in Surface Science Award of the Surfaces in Biomaterials Foundation (1996); Pittsburgh Spectroscopy Award (1991); National Fresenius Award, American Chemical Society (1981); and the Coblentz Memorial Prize in Molecular Spectroscopy (1980).
Van Duyne is also a fellow of the Society of Applied Spectroscopy (2013), the Royal Society of Chemistry (2013), the American Physical Society (1985), and the American Association for the Advancement of Science (1983). He received his B.S. degree from Rensselaer Polytechnic Institute in 1967 and a PhD in analytical chemistry from the University of North Carolina in 1971.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.
Single Cell and Microplastic Analysis by ICP-MS with Automated Micro-Flow Sample Introduction
April 25th 2024Single cell ICP-MS (scICP-MS) is increasingly seen as a powerful and fast tool for the measurement of elements in individual cells, mainly due to the high sensitivity and selectivity of ICP-MS. Analysis is performed in the same way as single nanoparticle (spICP-MS) analysis, which has become a well-established technique for the analysis of nanoparticles and particles.
Hot News on Agilent LDIR, New Developments, and Future Perspective
April 25th 2024Watch this video featuring Darren Robey and Dr. Wesam Alwan from Agilent Technologies to gain insights into the future trends shaping microplastics research and the challenges of their characterization. Discover the essential components necessary for accurate microplastics analysis and learn how the Agilent 8700 LDIR system addresses these challenges. Offering rapid and precise analysis capabilities, along with easy sample preparation methods that minimize contamination, the Agilent 8700 LDIR system is at the forefront of advancing microplastics research.
