Short Courses
25–26 DPOLY Short Course: Case Studies in Polymer Physics from the Industrial Research World
Boston, MA
www.aps.org/meetings/march/events/workshops/dpoly.cfm
12 Introduction to Inductively Coupled Plasma Atomic Emission Spectrometry
Orlando, FL
12 Side Illuminated Optical Fiber Sensor with a High Density of Sensing Points
Orlando, FL
13 Fundamentals of Particle Size Analysis with an Emphasis on Light Scattering Techniques
Orlando, FL
14–15 Basic Theory, Instrumentation and Applications of Vibrational Spectroscopy (Raman, Mid-Infrared, and Near-Infrared) in Materials Science)
Orlando, FL
24–25 Analysis and Interpretation of Mass Spectral Data
San Diego, CA
24–25 Spectroscopic Method Development: Qualitative & Quantitative Techniques
San Diego, CA
26 High-Throughput Method Development for Drug Analysis by LC–MS
San Diego, CA
26–27 Infrared Spectral Interpretation: A Systematic Approach
San Diego, CA
27 Introduction to GLP Regulations and Bioanalytical Method Validation by LC–MS-MS
San Diego, CA
27–28 NMR Spectral Interpretation and Organic Spectroscopy: A Problem-Based Learning Approach
San Diego, CA
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.