Spectrum Scientific (SSI) was founded in 2004 on the principle of manufacturing the highest precision holographic gratings, replicated optical surfaces, and grating based optical systems available. With a presence in Japan, Australia, England, and more SSI has become a global supplier of replicated optics and gratings.
SSI combines the ability to deliver rapid prototypes with high fidelity replication services to offer a unique opportunity to quickly develop a custom product with high performance and high production volume.
Customer satisfaction is key to Spectrum Scientific. From design services, to rapid prototyping, and OEM production, Spectrum Scientific is here for all our customer's replicated optics needs. We utilize six sigma and lean manufacturing principles in our continuous effort to strive for excellence in all we do.
High volume manufacturer of holographic diffraction gratings, ruled gratings, Telecom gratings, concave gratings, spectrometers, HCR Hollow Cube Retroreflectors, OAP Off Axis Parabolic Mirrors, and custom replicated monolithic mirrors.
Spectrum Scientific Inc.
16692 Hale Ave
Suite A
Irvine, CA 92606
TELEPHONE
(949) 260-9900
FAX
(949) 260-9902
E-MAILsales@ssioptics.com
WEB SITEwww.ssioptics.com
YEAR FOUNDED
2004
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.
Single Cell and Microplastic Analysis by ICP-MS with Automated Micro-Flow Sample Introduction
April 25th 2024Single cell ICP-MS (scICP-MS) is increasingly seen as a powerful and fast tool for the measurement of elements in individual cells, mainly due to the high sensitivity and selectivity of ICP-MS. Analysis is performed in the same way as single nanoparticle (spICP-MS) analysis, which has become a well-established technique for the analysis of nanoparticles and particles.
Hot News on Agilent LDIR, New Developments, and Future Perspective
April 25th 2024Watch this video featuring Darren Robey and Dr. Wesam Alwan from Agilent Technologies to gain insights into the future trends shaping microplastics research and the challenges of their characterization. Discover the essential components necessary for accurate microplastics analysis and learn how the Agilent 8700 LDIR system addresses these challenges. Offering rapid and precise analysis capabilities, along with easy sample preparation methods that minimize contamination, the Agilent 8700 LDIR system is at the forefront of advancing microplastics research.