Author | Gang Jin

Gang Jin is with Institute of Mechanics, Chinese Academy of Sciences, Beijing, China.

Articles

Refractive Index and Thickness Analysis of Natural Silicon Dioxide Film Growing on Silicon with Variable-Angle Spectroscopic Ellipsometry

October 01, 2006

Spectroscopy

Article

October 2006. The authors investigate the optical properties and thickness of natural SiO2 thin films grown on silicon substrates simultaneously with a VASE system by choosing different angles of incidence and wavelength ranges.