Author | I. Girip

Articles

Characterization of GeSbSe Thin Films Synthesized by the Conventional Melt-Quenching Method

August 01, 2020

Spectroscopic ellipsometry, correlated with UV-vis-NIR spectroscopy, is used to determine the optical constants of thin films, such as in GexSb40-xSe60 chalcogenide glass.