L. Munteanu

Articles by L. Munteanu

Characterization of GeSbSe Thin Films Synthesized by the Conventional Melt-Quenching Method

ByN. Nedelcu,V. Chiroiu,L. Munteanu,I. Girip

August 1st 2020

Spectroscopic ellipsometry, correlated with UV-vis-NIR spectroscopy, is used to determine the optical constants of thin films, such as in GexSb40-xSe60 chalcogenide glass.

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Characterization of GeSbSe Thin Films Synthesized by the Conventional Melt-Quenching Method
Published: August 1st 2020 | Updated:

L. Munteanu

Articles by L. Munteanu

Characterization of GeSbSe Thin Films Synthesized by the Conventional Melt-Quenching Method

Latest Updated Articles

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