Spectroscopic ellipsometry, correlated with UV-vis-NIR spectroscopy, is used to determine the optical constants of thin films, such as in GexSb40-xSe60 chalcogenide glass.
V. Chiroiu
Advertisement
Articles by V. Chiroiu
Advertisement
Latest Updated Articles
Characterization of GeSbSe Thin Films Synthesized by the Conventional Melt-Quenching MethodPublished: August 1st 2020 | Updated:
Advertisement
Advertisement
Trending on Spectroscopy Online
1
Recent Research in Chemometrics and AI for Spectroscopy, Part II: Emerging Applications, Explainable AI, and Future Trends
2
One Month Later: Reflecting on the 2025 SciX Conference
3
AI Model Enhances Accuracy of Breast Cancer Prognosis Predictions
4
Spectroscopy Solutions for Honey Authentication
5
