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V. Chiroiu

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Articles

Characterization of GeSbSe Thin Films Synthesized by the Conventional Melt-Quenching Method

Characterization of GeSbSe Thin Films Synthesized by the Conventional Melt-Quenching Method

N. Nedelcu;V. Chiroiu;L. Munteanu;I. Girip
August 1st 2020

Spectroscopic ellipsometry, correlated with UV-vis-NIR spectroscopy, is used to determine the optical constants of thin films, such as in GexSb40-xSe60 chalcogenide glass.

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