Spectroscopic ellipsometry, correlated with UV-vis-NIR spectroscopy, is used to determine the optical constants of thin films, such as in GexSb40-xSe60 chalcogenide glass.
V. Chiroiu
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Characterization of GeSbSe Thin Films Synthesized by the Conventional Melt-Quenching MethodPublished: August 1st 2020 | Updated:
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