
News|Articles|October 25, 2023
Raman and PSI Study of Graphene
Author(s)Nanobase, Inc.
XperRAM S combined with a phase shifting interferometer is capable of analyzing the surface structure of nanomaterials such as graphene, 2D materials, and TMD.
Trending on Spectroscopy Online
1
New Fiber-Optic Sensor Detects Ammonia at Parts-Per-Billion Levels
2
Where Can DMF-SERS Be Implemented in Clinical Settings?
3
Researchers Turn Waste Wood into Formaldehyde Sensor That Changes Color with Contamination Level
4
New Fluorescent Sensor Detects Carcinogenic Hydrazine Across Soil, Water, and Plant Tissue
5