Raman and PSI Study of Graphene
Published on:
Nanobase, Inc.
Sponsored Content
XperRAM S combined with a phase shifting interferometer is capable of analyzing the surface structure of nanomaterials such as graphene, 2D materials, and TMD.
Sponsored Content
XperRAM S combined with a phase shifting interferometer is capable of analyzing the surface structure of nanomaterials such as graphene, 2D materials, and TMD.