Webinar Date/Time: Wednesday, December 11th, 11:00 AM EST
Photothermal Spectroscopy Corp
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Articles by Photothermal Spectroscopy Corp
Learn how sub-micron resolution IR microscopy and high-speed spectroscopy overcomes the limitations of Raman spectroscopy for advanced failure analysis applications.
Learn how O-PTIR spectroscopy overcomes the limitations of Raman, providing automated measurement and chemID of sub-micron sized microplastics.
Learn how simultaneous O-PTIR and Raman provide high resolution IR imaging and spectroscopy of multilayer laminate film with minimal sample preparation.
Explains how O-PTIR spectroscopy overcomes the limitations of Raman spectroscopy by measuring defects in recessed semiconductor packaging structures.
Learn how sub-500nm resolution O-PTIR and co-located fluorescence microscopy combine to offer new insights and breakthroughs for life science research.
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Latest Updated Articles
- Sub-micron IR Spectroscopy for Failure Analysis
Published: January 17th 2024 | Updated:
- Microplastics chemID with sub-micron IR Spectroscopy
Published: January 17th 2024 | Updated:
- Simultaneous IR+Raman for Materials Science Applications
Published: January 17th 2024 | Updated:
- Semiconductor: Sub-micron IR Spectroscopy of Defects in Recessed Structures
Published: January 17th 2024 | Updated:
- Life Science Applications with O-PTIR and Fluorescence
Published: January 17th 2024 | Updated:
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