Rina K. Dukor

Articles

Carbon Nanotube Characterization and Quality Control Using Portable Raman: 532-nm Versus 785-nm Laser Excitation

September 01, 2016

In this paper, we examine the relative performance of 532 and 785 nm portable Raman systems, as well as demonstrate an automated analytical methodology applicable for carbon nanotube (CNT) characterization and quality control applications. Both 532 and 785 nm Raman spectra were used to directly analyze and compare important CNT structural parameters and properties including CNT diameters, diameter distributions, CNT structural quality (% of defects), CNT types, and other properties. The data indicate advantages in a number of areas for using 532 versus 785 nm excitation for CNT Raman measurements.

Recent Developments in Handheld Raman Spectroscopy for Industry, Pharma, Forensics, and Homeland Security: 532-nm Excitation Revisited

June 01, 2016

Recent advances in Raman instrumentation have resulted in the development of easy-to-use and efficient handheld Raman analyzers. Most of the commercially available handheld Raman devices utilize 785 or 1064 nm excitation. This paper directly demonstrates the performance of 532 nm handheld Raman (versus 785 and 1064 nm) for the analysis of biopharmaceuticals for structure and counterfeit testing as well as explosive detection (TSA screening and CSI applications). The results presented here will contribute to recognition of 532 nm Raman excitation as a highly attractive option for a rapid “in-place” analysis in the field.