SPECTRO Analytical Instruments, Inc


Micronutrient Analysis At Line with ED-XRF

January 13, 2016

Elemental analysis of materials at line is improving product quality, consistency, and maximizing throughput versus traditional lab-based QC methods. Learn analytical results from a new generation of rugged, portable, lab-quality XRF spectrometers.

Echelle vs ORCA –– Which ICP-OES optical technology offers superior performance?

July 21, 2015

This paper explains fundamental differences between two leading optical designs as used in high performance spectrometers. The paper explains how each technology deals with technical challenges such as light loss, stray light, spectral order overlaps, and others. Application examples and analytical results are included. Learn more now.