For 30 years, Spectroscopy has provided its readers with valuable content, advice, troubleshooting tips, and insight to many areas of materials analysis. Our mission statement says
For 30 years, Spectroscopy has provided its readers with valuable content, advice, troubleshooting tips, and insight to many areas of materials analysis. Our mission statement says
Spectroscopy's mission is to enhance productivity, efficiency, and the overall value of spectroscopic instruments and methods as a practical analytical technology across a variety of fields. Scientists, technicians, and laboratory managers gain proficiency and competitive advantage for the real-world issues they face through unbiased, peer-reviewed technical articles, trusted troubleshooting advice, and best-practice application solutions.
I believe we have lived up to that mission statement very well during the past three decades, but it would not have been possible without the invaluable work of our columnists, peer-reviewed authors, editorial advisory board, advertisers, and, of course, the editorial and sales staff at Spectroscopy-both past and present. In honor of our 30th anniversary celebration this month, I would like to say thank you to everyone that has contributed to Spectroscopy over the years. I'd also like to extend a thank you to our readers, who always push us to do better and provide the best content to meet their specific needs.
Our magazine is a staple in the spectroscopic community because of the hard work and dedication of our staff and contributors. Below you will find photos of the terrific and hard-working staff at Spectroscopy. Please feel free to say hello to us at conferences and industry events.
Thank you again to everyone who has been a part of this publication. Here's to the next 30 years!
Michael J. Tessalone
Science Group Publisher
mtessalone@advanstar.com
Michael J. Tessalone
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.