
- Spectroscopy-12-01-2013
- Volume 28
- Issue 12
Bruker Corporation
The Bruker name has become synonymous with the excellence, innovation, and quality that characterizes our comprehensive range of scientific instrumentation.
Company Description
The Bruker name has become synonymous with the excellence, innovation, and quality that characterizes our comprehensive range of scientific instrumentation. Our solutions encompass a wide number of analytical techniques ranging from magnetic resonance to mass spectrometry, to optical and X-ray spectroscopy.
These market- and technology-leading products are driving and facilitating many key application areas such as life science research, pharmaceutical analysis, applied analytical chemistry applications, materials research and nanotechnology, clinical research, molecular diagnostics, and homeland defense.
Visit our website to discover more about our technologies and solutions. Bruker — Innovation with Integrity!
Chief Spectroscopic Techniques Supported
- FT-infrared spectroscopy and microscopy (FT-IR)
- FT-near infrared spectroscopy (FT-NIR)
- Raman spectroscopy and microscopy
- Terahertz spectroscopy and imaging
- Liquid chromatography–mass spectrometry (LC–MS)
- FT-mass spectrometry (FTMS)
- MALDI-TOF (/TOF) mass spectrometry
- Inductively coupled plasma mass spectrometry (ICP-MS)
- Gas chromatography–mass spectrometry (GC–MS)
- Ion mobility spectrometry (IMS)
- Nuclear magnetic resonance (NMR)
- Electron paramagnetic resonance (EPR)
- Magnetic resonance imaging (MRI)
- Low resolution benchtop NMR analyzers
- X-ray crystallography (SC-XRD)
- X-ray diffraction (XRD)
- X-ray fluorescence (XRF)
- Handheld X-ray (XRF) spectrometers
- X-ray microanalysis (EDS, EBSD)
- Optical emission spectroscopy (OES)
- CS/ONH-Analysis
- Atomic force microscopy (AFM)
- Scanning probe microscopy (SPM)
- Stylus and optical metrology
Bruker Corporation
40 Manning Road
Billerica, MA 01821
TELEPHONE
(978) 663-3660
FAX
(978) 667-5993
WEB SITE
Articles in this issue
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PIKE Technologiesalmost 13 years ago
Amptek, Inc.almost 13 years ago
Ocean Opticsalmost 13 years ago
Photonis USAalmost 13 years ago
Reducing Background in Surface Enhanced Raman Scattering Measurementsalmost 13 years ago
Shimadzu Scientific Instrumentsalmost 13 years ago
Milestone, Inc.almost 13 years ago
Savillex Corporationalmost 13 years ago
WITec GmbH


