Call for Papers: Submit your paper to Spectroscopy
Submit your article for consideration to Spectroscopy!
Spectroscopy is seeking experts in analytical chemistry to submit technical articles for publication.
We’re looking for contributors who are interested in submitting tutorials, review articles, tips and tricks, blogs, peer-reviewed research, and more. Manuscripts and cover letter can be submitted directly to Associate Editorial Director Caroline Hroncich at chroncich@mjhlifesciences.com.
With your cover letter, please include a working title for your article, a summary of what you intend to cover, and any additional information that would be helpful to our editors. If approved for publication, your article will be edited by our staff. All articles are published on the Spectroscopy website with the opportunity to run in a future issue of the print magazine.
Before submitting, please review our editorial guidelines and ethics policy.
Founded in 1986, Spectroscopy provides peer-reviewed articles, trusted advice from expert columnists, and the latest breaking developments to facilitate the advance of analytical spectroscopy and its use as an essential tool across a variety of applications and fields.
Through our monthly print publication, website, newsletters, e-books, webcasts, interviews, and special issues, Spectroscopy provides academicians, laboratory scientists and managers, technicians, and those using analytical spectroscopy outside the laboratory with news, information about technical advances, best practices, and sage advice for improved proficiency and competitive advantage.
Spectroscopy has a circulation of more than 71,500 readers and a broad web reach through our online publishing. Spectroscopy is indexed in Web of Science: Science Citation Index Expanded; Journal Citation Reports, and Digital Object Identifier (DOI) system.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
