Elemental Scientific, Inc. (ESI), of Omaha, Nebraska, has acquired Electro Scientific Industries’ laser ablation division.
Elemental Scientific, Inc. (ESI), of Omaha, Nebraska, has acquired Electro Scientific Industries’ laser ablation division. The purchase of the division’s New Wave Research (NWR) line of laser ablation systems increases ESI’s portfolio of sample introduction systems for inductively-coupled plasma–atomic emission spectroscopy (ICP-AES) and inductively-coupled plasma mass spectrometry (ICP-MS) systems in trace and metal analysis.
The newly formed entity Elemental Scientific Lasers, LLC, based in Bozeman, Montana, will operate as a wholly-owned subsidiary of Elemental Scientific, Inc.
The laser ablation line acquired by ESI includes the NWR193, NWR213, NWR266, NWRfemto, and NWRimage laser ablation systems along with a series of compatible automation options.
Sales and marketing manager of the Laser Ablation Division, Ciaran O’Connor, said in a statement, “We’re excited to have the NWR leading laser technology join ESI’s highly respected and successful sample introduction and automation offering for ICP and ICP-MS.”
In another statement, Dan Wiederin, the founder and president of ESI, said, “This acquisition enables us to offer a complete portfolio of sample introduction (liquid and solid) solutions, expand development of ablation techniques, and synergize research and development strengths. We’re delighted to have this technology and the operations-dedicated teams join our company.”
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.
Single Cell and Microplastic Analysis by ICP-MS with Automated Micro-Flow Sample Introduction
April 25th 2024Single cell ICP-MS (scICP-MS) is increasingly seen as a powerful and fast tool for the measurement of elements in individual cells, mainly due to the high sensitivity and selectivity of ICP-MS. Analysis is performed in the same way as single nanoparticle (spICP-MS) analysis, which has become a well-established technique for the analysis of nanoparticles and particles.
Hot News on Agilent LDIR, New Developments, and Future Perspective
April 25th 2024Watch this video featuring Darren Robey and Dr. Wesam Alwan from Agilent Technologies to gain insights into the future trends shaping microplastics research and the challenges of their characterization. Discover the essential components necessary for accurate microplastics analysis and learn how the Agilent 8700 LDIR system addresses these challenges. Offering rapid and precise analysis capabilities, along with easy sample preparation methods that minimize contamination, the Agilent 8700 LDIR system is at the forefront of advancing microplastics research.