Gordon F. Kirkbright Bursary Award, 2013
Applications are invited for the 2013 Gordon F. Kirkbright Bursary Award, which enables a promising student or non-tenured young scientist of any nation to attend a recognized scientific meeting or visit a place of learning.
Applications are invited for the 2013 Gordon F. Kirkbright Bursary Award, which enables a promising student or non-tenured young scientist of any nation to attend a recognized scientific meeting or visit a place of learning.
The fund for this bursary was established in 1985 as a memorial to Gordon Kirkbright in recognition of his contributions to analytical spectroscopy and to science in general. Although the Association of British Spectroscopists Trust administers the fund, the award is not restricted to spectroscopists.
The closing date for entries is December 31, 2012.
For more information, contact John Chalmers at vibspecconsult@aol.com
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Achieving Accurate IR Spectra On Monolayer of Molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
