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2nd Annual Molecular Spectroscopy in Practice – On Demand Atomic Pair Distribution Function and its Uses for Pharmaceutical Material Characterization Data Integrity within Material Analysis Using the Rigaku Raman Analyzer Forensics Applications of Raman Spectroscopy, ATR FT-IR, and Chemometrics Resonant Surface-Enhanced Infrared Spectroscopy (Resonant SEIRA) Using Metal Nanoantennas

2nd Annual Molecular Spectroscopy in Practice – On DemandAtomic Pair Distribution Function and its Uses for Pharmaceutical Material CharacterizationData Integrity within Material Analysis Using the Rigaku Raman AnalyzerForensics Applications of Raman Spectroscopy, ATR FT-IR, and ChemometricsResonant Surface-Enhanced Infrared Spectroscopy (Resonant SEIRA) Using Metal Nanoantennas

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2nd Annual Molecular Spectroscopy in Practice – On Demand
Atomic Pair Distribution Function and its Uses for Pharmaceutical Material Characterization
Data Integrity within Material Analysis Using the Rigaku Raman Analyzer
Forensics Applications of Raman Spectroscopy, ATR FT-IR, and Chemometrics
Resonant Surface-Enhanced Infrared Spectroscopy (Resonant SEIRA) Using Metal Nanoantennas

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Raman
IR
ICP
X-ray Analysis
LIBS
Fluorescence

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Contact Us
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Do Not Sell My Personal Info
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Identifying Contamination in Trace Metal Laboratories

March 1, 2006

Application Notebook

Application Notebook, Application Notebook-03-01-2006, Volume 0, Issue 0

Ralph H. Obenauf and Nimi Kocherlakota, Spex CertiPrep, Inc.