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2nd Annual Molecular Spectroscopy in Practice – July 27th & 28th 10 Reasons You Need a Next-Generation ICP-OES for Routine Analysis The Staples of the Modern Analytical Laboratory Chemical Nanoscale Characterization of Heterogenous Polymeric Materials Using Photothermal AFM-IR Effect of Sampling Optics on Raman Depth Profiling

2nd Annual Molecular Spectroscopy in Practice – July 27th & 28th10 Reasons You Need a Next-Generation ICP-OES for Routine Analysis The Staples of the Modern Analytical LaboratoryChemical Nanoscale Characterization of Heterogenous Polymeric Materials Using Photothermal AFM-IREffect of Sampling Optics on Raman Depth Profiling

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2nd Annual Molecular Spectroscopy in Practice – July 27th & 28th
10 Reasons You Need a Next-Generation ICP-OES for Routine Analysis
The Staples of the Modern Analytical Laboratory
Chemical Nanoscale Characterization of Heterogenous Polymeric Materials Using Photothermal AFM-IR
Effect of Sampling Optics on Raman Depth Profiling

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X-ray Analysis
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Fluorescence

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Identifying Contamination in Trace Metal Laboratories

March 1, 2006

Application Notebook

Application Notebook, Application Notebook-03-01-2006, Volume 0, Issue 0

Ralph H. Obenauf and Nimi Kocherlakota, Spex CertiPrep, Inc.