Measuring Atmospheric Gases
INESC Porto?s Optoelectronics and Electronic System Unit (Porto, Portugal) in partnership with the European Space Agency, has developed a technology that enables a more effective measurement of gases in the atmosphere than that achieved with current techniques (such as atmospheric balloons and specially equipped airplanes).
INESC Porto’s Optoelectronics and Electronic System Unit (Porto, Portugal) in partnership with the European Space Agency, has developed a technology that enables a more effective measurement of gases in the atmosphere than that achieved with current techniques (such as atmospheric balloons and specially equipped airplanes). The system consists of an ultra-narrow spectral tunable and heat-reflecting filter based on optical fiber technology that can be used to monitor the atmosphere with the reflection of laser impulses. If it is applied to satellites, this filter will be able to detect pollutant gases in the Earth’s atmosphere in concentrations less than 1 km high and 50 km wide, at an altitude of 400 km. This technology is capable of providing precise measurements of several greenhouse gases including carbon dioxide, methane, nitrous oxide, and ozone.
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.
Single Cell and Microplastic Analysis by ICP-MS with Automated Micro-Flow Sample Introduction
April 25th 2024Single cell ICP-MS (scICP-MS) is increasingly seen as a powerful and fast tool for the measurement of elements in individual cells, mainly due to the high sensitivity and selectivity of ICP-MS. Analysis is performed in the same way as single nanoparticle (spICP-MS) analysis, which has become a well-established technique for the analysis of nanoparticles and particles.
Hot News on Agilent LDIR, New Developments, and Future Perspective
April 25th 2024Watch this video featuring Darren Robey and Dr. Wesam Alwan from Agilent Technologies to gain insights into the future trends shaping microplastics research and the challenges of their characterization. Discover the essential components necessary for accurate microplastics analysis and learn how the Agilent 8700 LDIR system addresses these challenges. Offering rapid and precise analysis capabilities, along with easy sample preparation methods that minimize contamination, the Agilent 8700 LDIR system is at the forefront of advancing microplastics research.
