The Ron A. Hites Award
The Ron A. Hites Award will be given to Professor Facundo Fernández today in Ballroom ACE from 4:45-5:30 PM. The award recognizes a high quality presentation of outstanding original research.
The Ron A. Hites Award will be given to Professor Facundo Fernández today in Ballroom ACE from 4:45-5:30 PM. The award recognizes a high quality presentation of outstanding original research.
The award is named in honor of Professor Ronald A. Hites, of Indiana University, who led the creation of JASMS in 1988 while president of ASMS. The award is given annually for an exemplary paper published in the previous two volumes of the Journal of the American Society for Mass Spectrometry. The award-winning manuscript is selected by a confidential committee. Selection is based on the committee’s judgment of each paper’s innovative aspects, technical quality, likely stimulation of future research, likely impact on future applications, and quality of presentation. Manuscript citations and impact factor may also be considered, but are not the major determinants of selection. The corresponding author will receive a personal award of $2000 and all co-authors will receive certificates of commendation.
Professor Facundo Fernández is being awarded for the article, “Direct Quantitation of Active Ingredients in Solid Artesunate Antimalarials by Noncovalent Complex Forming Reactive Desorption Electrospray Ionization Mass Spectrometry;” Leonard Nyadong, Sameer Late, Michael D. Grren, Ajay Banga, and Facundo Fernández; JASMS 2008, Vol. 19, 380-388. Fernández is in the School of Chemistry and Biochemistry, Georgia Institute of Technology.
The staff of Spectroscopy and LCGC would like to congratulate Professor Facundo Fernández and his co-authors on their outstanding article!
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
