|Articles|June 21, 2021
Semi-Automated FT-IR Measurements of Elemental Impurities in Silicon Wafers
Author(s)PerkinElmer
Learn how FT-IR spectroscopy offers a rapid and easy technique to determine impurities in semiconductor wafers according to global standard methods.
Newsletter
Get essential updates on the latest spectroscopy technologies, regulatory standards, and best practices—subscribe today to Spectroscopy.
Trending on Spectroscopy Online
1
Generative Artificial Intelligence in Spectroscopy: Extending the Foundations of Chemometrics
2
Taming Matrix Effects: Data-Driven Strategies for More Accurate Elemental Analysis
3
Navigating the Latest Trends and Advancements in Forensic Analysis
4
What Does the Future Hold for High-Precision Metal Isotope Analysis?
5