Spectral Systems is the leader in precise infrared optical components, coatings, systems integration, and services from original concept through final production.
With over 32 years of experience we can ensure your optics are made to meet your specifications. Our facility is equipped with state of the art polishing, coating, and inspection equipment to ensure your optics are fabricated consistently and efficiently.
We have the most comprehensive capabilities to provide optical solutions for the entire infrared spectral range, from the vacuum UV to the far-IR, no one else can cover the infrared spectrum better than Spectral Systems. We routinely work with over 16 infrared materials and have a broad range of proprietary coating solutions to meet all your needs.
Headquartered in Hopewell Junction, New York, with other offices in Connecticut and Wisconsin.
Spectral Systems LLC
35 Corporate Park Drive
Hopewell Junction, NY 12533
TELEPHONE
(845) 896-2200
FAX
(845) 896-2203
E-MAILinfo@spectral-systems.com
WEB SITEwww.spectral-systems.com
NUMBER OF EMPLOYEES
50+
YEAR FOUNDED
1983
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Achieving Accurate IR Spectra On Monolayer of Molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.