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|Articles|December 1, 2015

Spectroscopy

  • Spectroscopy-12-01-2015
  • Volume 30
  • Issue 12

Spectral Systems LLC

Company Description

Spectral Systems is the leader in precise infrared optical components, coatings, systems integration, and services from original concept through final production.

With over 32 years of experience we can ensure your optics are made to meet your specifications. Our facility is equipped with state of the art polishing, coating, and inspection equipment to ensure your optics are fabricated consistently and efficiently.

We have the most comprehensive capabilities to provide optical solutions for the entire infrared spectral range, from the vacuum UV to the far-IR, no one else can cover the infrared spectrum better than Spectral Systems. We routinely work with over 16 infrared materials and have a broad range of proprietary coating solutions to meet all your needs.

Chief Spectroscopic Techniques Supported

  • FT-IR spectroscopy optical components and assemblies

  • FT-IR spectroscopy supplies

  • Infrared liquid cells

  • Infrared liquid flow cells

  • FT-IR beamsplitters

  • Infrared reflective mirrors and refractive lenses

Markets Served

  • FT-IR instrument manufacturers

  • Analytical chemistry laboratories

  • Government and military

  • Education

  • Manufacturing

Major Products/Services

  • Optical component design and manufacturing

  • Coating design and manufacture

  • Sub-system assembly and testing

  • System design and manufacture

  • Rapid prototyping

  • Quality assurance

  • Infrared windows

  • Liquid cells

  • ATR optical elements

  • Infrared optical elements

  • Infrared optical coatings

  • Infrared beamsplitters

Facility

Headquartered in Hopewell Junction, New York, with other offices in Connecticut and Wisconsin.

Spectral Systems LLC
35 Corporate Park Drive
Hopewell Junction, NY 12533

TELEPHONE
(845) 896-2200

FAX
(845) 896-2203

E-MAILinfo@spectral-systems.com

WEB SITEwww.spectral-systems.com

NUMBER OF EMPLOYEES
50+

YEAR FOUNDED
1983

Articles in this issue

almost 11 years ago

Combining Raman Imaging, Mass Spectrometry Imaging, and AFM

almost 11 years ago

The Correlation Method for the Determination of Spectroscopically Active Vibrational Modes in Crystals

almost 11 years ago

Quo Vadis Regulated NIR Analytical Procedures?

almost 11 years ago

Effect of Azimuthal Angle on Infrared Diffuse Reflection Spectra of Fabrics

almost 11 years ago

Analysis of Coal Fly Ash

almost 11 years ago

Agilent Technologies, Inc.

almost 11 years ago

ABB Measurement & Analytics

almost 11 years ago

Andor Technology Ltd.

almost 11 years ago

Polarization in FTIR ATR

almost 11 years ago

Miniature 60 kV, 1000 μA 12 W X-ray Source

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