Kenneth D. Kempfert

Kenneth D. Kempfert is with PIKE Technologies.


Rapid Micro-Sampling by ATR/FT-IR

September 01, 2009

In ATR/FT-IR, magnified visual monitoring of a sample benefits many applications. For micro-sampling and defect analysis, viewing capabilities decrease overall measurement time by allowing the user to locate the desired sampling area quickly and enhance confidence in the collected data by assuring the sampling point. Visual changes in the sample also may be easily monitored during testing. As an example application, the ease of micro-sampling is shown through fiber analysis and the results are discussed.