PerkinElmer

Analysis of in-Service Greases with PerkinElmer Spectrum Two FTIR and Specac Pearl Liquid Transmission Accessory

Accurate biomonitoring is critical for occupational health, environmental exposure, and clinical research, but it requires instruments that can handle complex biological matrices, small sample volumes, and ultra-trace detection with high throughput

Webinar Date/Time: Tue, Sep 2, 2025 10:00 AM EDT

ICP-MS offers ultra-sensitive metal impurities analyses in LiBs cathodes, with the NexION® 1100 ICP-MS helping meet stricter quality standards for better battery performance.

Additives are often utilized to enhance Li-ion battery performance. The Avio® 550 Max ICP-OES provides a suitable test method for additives to Li-ion battery cathodes.

SiBs are a safer, cheaper, greener alternative to LiBs. PerkinElmer's Avio® 550 Max ICP-OES ensures precise, efficient analysis of SiBs cathode materials.

Advanced laboratory solutions enable the development of safer, lighter solid-state batteries, driving EV innovation and supporting the renewable energy shift.

This white paper discusses the key trends, challenges, and potential of emerging battery technologies like solid-state, Li-ion, Na-ion, and recycling advancements.

Solid electrolytes boost Li-ion battery safety and performance. PerkinElmer's Avio® 220 Max ICP-OES ensures precise impurity control below 0.1% for optimal results.

EV demand is growing, boosting Li-ion battery use. The Avio® 550 Max ICP-OES provides accurate, repeatable determinations of the molar ratio of Li to sum of metals in NCMA.

TMA and STA technologies allow in-situ monitoring of the sintering process of solid electrolyte powders, optimizing solid-state battery performance.

Webinar Date/Time: Wednesday, June 11, 2025 at 8am PDT | 11am EDT | 4pm BST | 5pm CEST

Webinar Date/Time: Tuesday, May 27, 2025 at 11:00 AM EST

Quality assurance and quality control (QA/QC) are essential in pharmaceutical manufacturing to ensure compliance with standards like United States Pharmacopoeia <232> and ICH Q3D, as well as FDA regulations. Reliable and user-friendly testing solutions help QA/QC labs deliver precise trace elemental analyses while meeting throughput demands and data security requirements.

ICP-MS is the top choice for trace element analysis in bodily fluids. The NexION® 5000 ensures fast, precise detection in serum with simple sample prep.

USP and ICH Q3D set strict limits for elemental impurities in drugs. The NexION® 1100 ICP-MS ensures accurate, interference-free analysis of pharmaceutical products.

Controlling metal impurities in CO is vital for semiconductor fabrication. The NexION® 2200 ICP-MS with gas direct injection (GDI) enables faster, more sensitive analysis.

Trace impurities in tungsten hexacarbonyl must be measured precisely. The NexION® 1100 ICP-MS eliminates interferences, enabling accurate multi-element analysis.

ICP-MS is the go-to for detecting trace elements in bodily fluids. The NexION® 5000 makes urine analysis easy and precise with simple dilution—no digestion needed!

Ultra-pure NMP is essential in semiconductor fabrication. The NexION® 2200 ICP-MS enables precise, interference-free trace metal analysis, ensuring high-purity standards.

Si isotope analysis reveals insights into geological and biological processes. The NexION® 5000 ICP-MS offers high sensitivity, accuracy, and stability for precise ratio measurements.

Ultra-high-purity HCl is crucial in semicon wafer cleaning. The NexION® 2200 ICP-MS accurately quantifies ultra-trace impurities, minimizing interferences and sample prep.

See how the NexION® 5000 multi-quad ICP-MS offers exceptional performance and interference removal for trace metallic impurities in ultra-pure N-methyl-2-pyrrolidone.

Camston Wrather is transforming waste disposal with sustainable resource recovery from PCBs. Partnering with PerkinElmer, they’ve advanced eco-friendly solutions.

For the analysis of semiconductor-grade solvents, see how the NexION® 2200 ICP-MS accurately quantifies ppt-level impurities by reducing polyatomic interferences.

In semiconductor fabrication, controlling impurities is crucial. This work describes metallic nanoparticle analysis in sulfuric acid using the NexION® 5000 SP-ICP-MS.

Explore a method for ultratrace-level quantification of nanoparticle impurities in semiconductor-grade TMAH using NexION® 5000 ICP-MS for improved yield and performance.

This work demonstrates the ability of the NexION® 2200 ICP-MS to reliably and effectively quantify ultra-trace impurities at the ng/L level in concentrated HCl.

For improved semiconductor gas analysis, discover how Gas Direct Injection-ICP-MS simplifies sample prep, replacing impingers with direct analysis.

For non-metallic impurity analysis in dilute nitric acid, the NexION® 5000 ICP-MS uses a mixed-mode method to achieve low-ppt detection, overcoming spectral interferences.