News|Articles|February 6, 2025
Analysis of Metallic Nanoparticles in TMAH by Multi-Quad SP-ICP-MS
Author(s)PerkinElmer
Explore a method for ultratrace-level quantification of nanoparticle impurities in semiconductor-grade TMAH using NexION® 5000 ICP-MS for improved yield and performance.
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