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Spectroscopy-10-01-2006
Spectroscopy
Refractive Index and Thickness Analysis of Natural Silicon Dioxide Film Growing on Silicon with Variable-Angle Spectroscopic Ellipsometry
October 01, 2006
Articles
21
10
October 2006. The authors investigate the optical properties and thickness of natural SiO2 thin films grown on silicon substrates simultaneously with a VASE system by choosing different angles of incidence and wavelength ranges.
Electron Ionization: More Ins and Outs
October 01, 2006
Mass Spectrometry Forum
21
10
October 2006. Columnist Ken Busch continues his discussion of the El source and how source design and operational details directly affect source performance.
A Timeline of Atomic Spectroscopy
October 01, 2006
Articles
21
10
October 2006. This timeline provides a short history of the experimental and theoretical development of atomic spectroscopy for elemental spectrochemical analysis.
Market Profile: Absorbance Colorimeters
October 01, 2006
Departments
21
10
The worldwide market for absorbance colorimeters was worth close to $90 million in 2005. Colorimeters also are referred to as photometers and should not be confused with other fundamentally different types of instruments that are also referred to as colorimeters. They are commonly found at the heart of water testing kits that can be configured for numerous applications. Although the market is mature, demand for the technique remains cogent.
Think Small: Low-Cost Optical Spectral Measurements for Chemical Sensing
October 01, 2006
Molecular Spectroscopy Workbench
21
10
Guest author John Coates discusses a miniature spectral measurement system that operates as a full spectrum analyzer, a colorimeter, or a multichannel photometer in the form of a spectral engine.