April
April
8–12 April Surface Analysis 2013
Dayton, OH
www.surfaceanalysis.org/surface_analysis_2013.html
9 April Metals Analysis: AA, GFAA, ICP, ICP-MS
Orlando, FL & Indianapolis, IN
http://pacslabs.com/course/260aagraphitefurnaceatomicabsorptionicpcourse.php
10 April Mass Spectral Interpretation
Orlando, FL & Indianapolis, IN
http://pacslabs.com/course/10massspectralinterpretationcourse.php
15–19 April The 25th Annual Short Course on Electrochemical Impedance Spectroscopy: Theory, Applications, and Laboratory Instruction
Houston, TX
29 April–3 May Practical X-ray Fluorescence Spectrometry
Newtown Square, PA
www.icdd.com/education/xrf.htm
May
12 Basic Impedance Spectroscopy
Toronto, Ontario, Canada
www.electrochem.org/education/short_courses/223/sc1/
June
23–27 Applied Industrial Optics: Spectroscopy, Imaging, and Metrology (AIO)
Arlington, VA
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.