Imaging

The authors look at the ways in which an imaging FT-IR microscope system with an integrated linear array detector can aid in the examination of a wide array of samples.

The author discusses the use of filters in optical microscopy and the advantages that have been gained as a result of developments in filter technology.

The author discusses the improvements offered by silicon drift detector energy dispersive X-ray spectrometry (SDD-EDS) systems over the classic Si(Li)-EDS for mapping the compositional microstructure of matter with scanning electron microscopy (SEM).

In this article, the authors discuss the need for protection against chemical attacks and the role of passive imaging spectroradiometers in the detection of remote chemical agents.

The author discusses how researchers can gain the most accurate and useful data from their equipment by employing careful sampling and microscope techniques and following a few common best practices.