Appendix XIV: X-Ray

Article

Spectroscopy

SpectroscopySpectroscopy-05-01-2013
Volume 28
Issue 5

Additional information from the X-ray section of the Pittcon Review article.

Manufacturer: Applied Rigaku Technologies, Inc.

rigaku.com

Product name: NEX OL

EDXRF Multi-Element Process Analyzer

New this year: New product line being introduced at Pittcon.

For: Process analysis

Measurement Mode: Energy Dispersive X-ray Fluorescence (EDXRF)

Special Features: High resolution EDXRF multi-element process analyzer. Adaptable to single or multi-stream liquid applications in addition to moving web coating thickness measurements. Simplified user interface and standard platform for communicating to plant wide Distributed Control Systems (DCS).

Suggested applications: Liquid streams and web based coating thickness applications

Primary benefits: Continuous real time feedback on process conditions.

Unique features: Multi-element 50 kV Silicone Drift Detector based process analyzer with simple user interface, live calibration update feature, and standard platform for communicating to plant wide DCS. System adaptable to single or multi-stream liquid applications and web based coating applications.

Manufacturer: Elvatech, Ltd.

elvatech.com

Product name: ProSpector

Handheld XRF Spectrometer

Used for: Handheld/portable Applications

Dimensions: 242 mm x 230 mm x 78 mm

Measurement Mode: XRF

Special Features: 8 hours battery operation time, hi-res 4" touch-screen, detection range from Mg to U, fundamental parameters calibrations, empirical calibrations

Suggested applications: Ferrous and non-ferrous alloy sorting, RoHS WEEE and Proposition 65 compliance testing, Lead determination in paint, toys, furniture and clothing, Soil and sediments analysis, Mining and geology, Art and archeology

Manufacturer: Elvatech, Ltd.

elvatech.com

Product name: ElvaX Light

Benchtop XRF Spectrometer

Used for: Lab analysis

Dimensions: 43 cm x 34 cm x 20 cm

Measurement Mode: XRF

Special Features: benchtop XRF analyzer, automatic peak search, peak deconvolution, background removal, detection range from Na to U, fundamental parameters calibrations, empirical calibrations, quadratic stepwise multiple regression

Suggested applications: Metallurgy & chemical analysis, RoHS WEEE and Proposition 65 compliance testing, Lead determination in paint, toys, furniture and clothing, soil and sediments analysis, jewelry & precious metals assay, mining and geology, art and archeology

Manufacturer: Elvatech, Ltd.

elvatech.com

Product name: ElvaX Mini

Benchtop XRF Spectrometer

Used for: Lab analysis

Dimnsions: 22 cm X 34 cm X 20 cm

Measurement Mode: XRF

Special Features: same as ElvaX Light, above

Suggested applications: Jewelry and precious metals assay, Precise metal concentrations in complex alloys, WEEE/RoHS compliance testing and screening of regulated elements (Pb, Hg, Cr, Cd, Br)

Manufacturer: Elvatech, Ltd.

elvatech.com

Product name: ElvaX Mobile

Portable XRF Spectrometer

Used for: Lab analysis

Dimensions: 22 cm X 34 cm X 20 cm

Measurement Mode: XRF

Special Features: same as ElvaX Light, above

Suggested applications: Liquids and powders convenient analysis in the field, Elemental analysis of petrochemicals, Soil and sediment analysis, Mining, WEEE/RoHS compliance testing, and screening of regulated elements (Pb, Hg, Cr, Cd, Br)

Manufacturer: S.E. International, Inc.

seintl.com

Product name: Gamma Pal

Gamma-Ray spectrometer

New this year: Gamma Pal Radiation Spectrum Analyzer

Used for: Lab, Handheld/portable operation

21CFR11 compliant, compatible with other manufacturers' equipment

Special features: NaI probe, for Iodine 131, Cesium 134, Cesium 137

Suggested applications: Ionizing radiation in food, soil, water, air and other materials.

Manufacturer: XIA LLC

xia.com

Product name: FALCON X

Xray digital pulse processor

New this year: Extremely high count rates

Used for: Process analysis

Accessory: Digital Pulse Processor

Measurement Modes: Transmission, reflection, ATR

Special Features: X-Ray and Gamma ray

Software: Proprietary for data acquisition, control and analysis. Available as separate product, my be used in other equipment, compatible with other manufacturers' equipment

Suggested applications: Xafes, Nano and Micro probe analysis and scanning

Primary benefits: Significantly faster throughput at a higher count-rate.

Unique features: MCA mode operation at output count rates >1.5 million cps, advanced signal processing to correct for pulse pile-up/ detector dead-time, list mode operation for on-the-fly scanning at < 50 us dwell time, 16 auxiliary digital I/O connections, excellent pulse-pair resolution < 50 ns

Related Videos
John Burgener | Photo Credit: © Will Wetzel
Robert Jones speaks to Spectroscopy about his work at the CDC. | Photo Credit: © Will Wetzel
John Burgener | Photo Credit: © Will Wetzel
Robert Jones speaks to Spectroscopy about his work at the CDC. | Photo Credit: © Will Wetzel
John Burgener of Burgener Research Inc.
Related Content