International Centre for Diffraction Data

December 1, 2016

Spectroscopy

Spectroscopy, Spectroscopy-12-01-2016, Volume 31, Issue 12

Company Description

ICDD is a non-profit scientific organization dedicated to collecting, editing, publishing, and distributing powder diffraction data for the identification of crystalline materials. Our mission is to continue to be the world center for quality diffraction and related data to meet the needs of the technical community. We promote the application of materials characterization methods in science and technology by providing forums for the exchange of ideas and information. We sponsor the Pharmaceutical Powder X-ray Diffraction Symposium (PPXRD); the Denver X-ray Conference; its proceedings, Advances in X-ray Analysis; and the journal Powder Diffraction. ICDD and its members conduct workshops and clinics on materials characterization at our headquarters in Newtown Square, Pennsylvania, and at X-ray analysis conferences around the world.

Chief Spectroscopic Techniques Supported

X-ray Diffraction

Electron Diffraction

Electron Backscatter Diffraction

Neutron Diffraction

Synchrotron Diffraction

Markets Served

The Powder Diffraction File^(tm) is designed for materials identification and characterization. ICDD databases are used worldwide by scientists in academia, government and industry who are actively engaged in the field of X-ray powder diffraction and related disciplines.

Major Products/Services

PDF-4+ is designed to support rapid phase identification and quantitative analysis by providing key reference data required for these analyses. It combines the world's largest sources of inorganic data from crystals and powders into a single database. PDF-4+ contains an array of tools, including a full suite of data simulation programs enabling the analysis of neutron, electron, and synchrotron data, in addition to X-ray. PDF-4+ features digitized patterns, molecular graphics, and atomic coordinates to enhance the ability to do quantitative analysis by any of three methods: Rietveld Analysis, Reference Intensity Ratio (RIR) Method, or Total Pattern Analysis.