|Articles|September 1, 2007

Application Notebook

  • Application Notebook-09-01-2007
  • Volume 0
  • Issue 0

Photovoltaic Device Characterization Using the UVISEL Spectroscopic Ellipsometer

Author(s)Eric Teboul

HORIBA Jobin Yvon, Inc.

To view a PDF of this article from the Spectroscopy Online archives, click this link.

Articles in this issue

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Miniature Spectrometers: Preventive Maintenance and Calibration

over 18 years ago

High Throughput Metabolic Stability Screening by MALDI Triple Quadrupole Analysis

over 18 years ago

Determination of Absolute Configuration

over 18 years ago

Meeting Quality Control Requirements in the Routine Inorganic Laboratory

over 18 years ago

The Importance of Using Correct Sampling Procedures in Obtaining Representative and Meaningful Analysis Results

over 18 years ago

Classification of Bacteria Using FT-IR

over 18 years ago

Determination of Estradiol in Plasma with Negative Chemical Ionization GC-MS/MS on TSQ Quantum GC

over 18 years ago

RoHS/WEEE Application of a Miniature X-Ray Spectrometer

over 18 years ago

Mid-Infrared Transmission and Reflection Microcpectroscopy: Analysis of a Novel Biological Imaging System: The Snake Infrared-Imaging Pit Organ

over 18 years ago

FT-IR Spectroscopy Inside a Glovebox

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