News
Article
Sponsored Content
Poster Presentation - RISE imaging of various phases of SiC in sintered silicon-carbide ceramics
Author(s):
In this poster presentation applications manager Ute Schmidt discusses the use of correlative Raman-SEM (RISE Microscopy) imaging for analyzing silicon-carbide (SiC) ceramics. The main focus of the work is investigating the distribution of sub-micron structured polytypes of SiC grains on and below the surface.
Newsletter
Get essential updates on the latest spectroscopy technologies, regulatory standards, and best practices—subscribe today to Spectroscopy.
Related Content
