News|Articles|November 12, 2024
Poster Presentation - RISE imaging of various phases of SiC in sintered silicon-carbide ceramics
Author(s)Oxford Instruments WITec
In this poster presentation applications manager Ute Schmidt discusses the use of correlative Raman-SEM (RISE Microscopy) imaging for analyzing silicon-carbide (SiC) ceramics. The main focus of the work is investigating the distribution of sub-micron structured polytypes of SiC grains on and below the surface.
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