Jenni Briggs
Jenni Briggs received her Ph.D. from Purdue University. For the past 15 years, she has been working in the field of infrared for the past 15 years and has been with PIKE Technologies for the past 12 years. She specializes in NIR/MIR sampling techniques. Serving as an applications engineer, she assists users choose the best sampling solution for applications.
Articles
Common Problems with FT-IR Instruments and How to Avoid Them
Published: September 2nd 2021 | Updated: August 18th 2025Those inexperienced in using FT-IR spectrometers can encounter problems when measuring spectra. This article discusses several main issues that most users experience while using FT-IR spectrometers and how to remedy each problem.
Latest Updated Articles
Published: September 2nd 2021 | Updated: August 18th 2025
Common Problems with FT-IR Instruments and How to Avoid Them
Published: August 2nd 2019 | Updated: July 23rd 2025
How to Choose the Correct Wavelength in ICP-OES
Published: June 9th 2025 | Updated: June 17th 2025
Tip-enhanced Raman Scattering Using a Chemically-Modified Tip
Published: March 3rd 2025 | Updated: May 1st 2025
A New Radiation: C.V. Raman and the Dawn of Quantum Spectroscopy, Part I
Published: April 9th 2024 | Updated: May 1st 2025
Measurement of Ammonia Leakage by TDLAS in Mid-Infrared Combined with an EMD-SG Filter Method
Published: September 11th 2024 | Updated: October 10th 2024
In-Service Samples: An Infrared Differential Spectra Issue
