PIKE Technologies, Inc.

Articles

Non-Destructive FT-IR Measurements via Diffuse Reflection Sampling

February 01, 2021

For analysis of non-particulate solids, the diffuse reflection sampling technique may offer an easy, non-destructive method for mid-infrared measurements. Spectral results of a polypropylene face mask collected via diffuse reflection and attenuated total reflection (ATR) were compared.