Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.
Analyzing Mummies' Hair Using LA-ICP-MS: An Interview with Dula Amarasiriwardena
March 7th 2024Dulasiri Amarasiriwardena, emeritus professor of chemistry at Hampshire College, Amherst, Massachusetts, and his team have been conducting research using laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS) to investigate trace metal nutrition and exposure to toxic metal(loid) pollutants by studying Andean mummy remains. We sat down with Prof. Amarasiriwardena to discuss his research.