Harrick Scientific Products specializes in designing and manufacturing instruments for optical spectroscopy. Since being established in 1969, Harrick Scientific has advanced the frontiers of optical spectroscopy through its innovations in all spectroscopic techniques. The founder of the company, Dr. N.J. Harrick, pioneered attenuated total reflection (ATR) spectroscopy and became the principal developer of this technique. Harrick Scientific offers a complete selection of sampling accessories, including both standard and custom designs, as well as an extensive line of optical elements.
Harrick Scientific serves analytical markets worldwide. Harrick's customers typically are from research or quality control laboratories of industrial, governmental, research, and academic institutions throughout the world. Industries served include chemical, electronic, pharmaceutical, forensics, and biomedical.
Harrick Scientific offers the most complete line of spectroscopy sampling products, including:
Harrick Scientific Products is located 30 miles north of New York City in Pleasantville, New York. Our products are also available through FT-IR and UV–vis spectrometer manufacturers, as well as distributors in the United States and throughout the world.
Harrick Scientific Products, Inc.
141 Tompkins Ave, 2nd Floor
Pleasantville, NY 10570
TELEPHONE
(800) 248-3847
FAX
(914) 747-7209
E-mail info@harricksci.com
WEB SITE www.harricksci.com
NUMBER OF EMPLOYEES
25
YEAR FOUNDED
1969
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.