HORIBA Scientific is the world-leading manufacturer of high performance spectroscopic instrumentation and photonics components. Our products offer unsurpassed sensitivity, precision, performance, and capabilities.
HORIBA Scientific offerings encompass Raman, fluorescence, elemental analysis, forensics, GDS, ICP, particle characterization, spectroscopic ellipsometry, sulfur-in-oil, water quality, XRF, and OEM spectrometers. We also provide components, custom and OEM solutions, and worldwide support.
Our global team is dedicated to providing researchers with the highest quality products and solutions by integrating and aligning HORIBA's core strengths of scientific research, development, applications, sales, service, and support.
Prominent acquired brands include Jobin Yvon, IBH, SPEX, Instruments S.A., ISA, Dilor, Sofie, SLM, Beta Scientific, Photon Technology, Inc. (PTI), and Optical Building Blocks (OBB).
HORIBA Scientific is part of the HORIBA Group, with manufacturing facilities in Edison, New Jersey, as well as in France and Japan. Sales, service, and applications facilities are located around the world.
HORIBA Scientific
3880 Park Avenue
Edison, NJ 08820
TELEPHONE
(732) 494-8660
FAX
(732) 549-5125
E-MAILinfo.sci@horiba.com
WEB SITEwww.horiba.com/scientific
NUMBER OF EMPLOYEES
700
Elsewhere: 5000
YEAR FOUNDED
1819
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Deep Level Transient Spectroscopy Reveals Influence of Defects on 2D Semiconductor Devices
April 25th 2024A recent study used deep level transient spectroscopy to investigate the electrical response of defect filling and emission in monolayer metal-organic chemical vapor deposition (MOCVD)-grown materials deposited on complementary metal-oxide-semiconductor (CMOS)-compatible substrates.