July 3rd 2024
A recent study used fiber optics reflectance spectroscopy (FORS), X-ray fluorescence (XRF) spectroscopy, and Raman spectroscopy to characterize a painted shroud wrapped around a female Egyptian mummy.
Market Profile: Cement Analysis by XRF
July 1st 2008X-ray fluorescence spectroscopy (XRF) is one of the primary analytical tools used in the cement industry for a variety of related applications. The principle of XRF is relatively simple; a source directs X-rays onto the atoms of the sample, ejecting electrons from the inner electron shells.
X-Ray Technology Today: An Overview
July 1st 2007The twentieth century saw the rise of several novel instrumental techniques based on the use of X-rays. Today, X-ray spectroscopy and diffractometry continue to prove their utility as advances in instrumentation produce new methods and enable new applications.
Basic Fundamental Parameters in X-Ray Fluorescence
May 1st 2007The "fundamental parameters" approach to calibration in X-ray fluorescence is unique because it is based upon the theoretical relationship between measured X-ray intensities and the concentrations of elements in the sample. This theoretical relationship is based upon X-ray physics and the measured values of fundamental atomic parameters in the X-ray region of the electromagnetic spectrum. In this tutorial, an introduction to the means of calibration is provided based upon a simplified instrument–sample geometry, thus eliminating some of the mathematical details of the traditional derivations.
An Overview of New Products at the Denver X-ray Conference (PDF)
July 1st 2003This article provides a brief overview of some of the latest spectroscopy-related equipment and supplies scheduled to be introduced at the 2003 Denver X-ray Conference at the Denver Marriott Tech Center Hotel in Denver, Colorado, August 4?8, 2003.