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|Articles|December 1, 2015

Spectroscopy

  • Spectroscopy-12-01-2015
  • Volume 30
  • Issue 12

Moxtek, Inc. Profile

Company Description

Since its founding in 1986, Moxtek has become a leading supplier of advanced nano-optical and X-ray components used in display electronics, imaging, and analytical instrumentation.


 

Moxtek empowers creators of cutting-edge technology to break the barriers of scientific performance by engineering precision solutions developed through shared expertise. It is our goal to become our customers' preferred supplier. To achieve customer satisfaction, Moxtek is committed to a culture of compliance to internal and external requirements, continuous improvements, collaboration, and customer focus. We are actively engaged in the development and manufacturing of innovative technology. We believe our future success lies in collaboration with both current and future partners. Please contact us with any ideas you may have for new products or collaboration.


 

Chief Spectroscopic Techniques Supported

  • Energy dispersive X-ray spectroscopy

  • Wavelength dispersive X-ray spectroscopy

  • X-ray diffraction

  • Microanalysis

  • UV, visible, IR spectrometry

Markets Served

Moxtek, Inc. serves the analytical instrumentation and projection display markets.

  • ProFlux Wiregrid Polarizers - High transmission and contrast inorganic polarizers for UV, visible, and IR applications.

  • MAGNUM® Miniature X-ray Sources - The leading X-ray source technology for handheld and bench top X-ray analysis applications.

  • XPIN Detectors - The latest generation of affordable Si-PIN detectors for X-ray fluorescence spectrometry.

  • AP5, AP3, and ProLINE Windows - Ultrathin polymer windows for energy and wavelength dispersive spectroscopy.

  • DuraBeryllium Windows - The most rugged and reliable beryllium windows available for X-ray applications.

Moxtek, Inc.
452 W 1260 N
Orem, UT 84057

TELEPHONE
(801) 225-0930

FAX
(801) 221-1121

E-MAILinfo@moxtek.com

WEB SITEwww.moxtek.com

NUMBER OF EMPLOYEES
200+

YEAR FOUNDED
1986

Articles in this issue

almost 11 years ago

Combining Raman Imaging, Mass Spectrometry Imaging, and AFM

almost 11 years ago

The Correlation Method for the Determination of Spectroscopically Active Vibrational Modes in Crystals

almost 11 years ago

Quo Vadis Regulated NIR Analytical Procedures?

almost 11 years ago

Effect of Azimuthal Angle on Infrared Diffuse Reflection Spectra of Fabrics

almost 11 years ago

Analysis of Coal Fly Ash

almost 11 years ago

Agilent Technologies, Inc.

almost 11 years ago

ABB Measurement & Analytics

almost 11 years ago

Andor Technology Ltd.

almost 11 years ago

Polarization in FTIR ATR

almost 11 years ago

Miniature 60 kV, 1000 μA 12 W X-ray Source

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