Feature|Videos|July 9, 2025

TOF-MS and ATD-GC-MS: Comparing Efficiency

The panel compares traditional ATD-GC-MS methods to emerging TOF-MS approaches for impurity and defect analysis, emphasizing speed and sensitivity advancements.

Episodes in this series

Accurate impurity detection ensures semiconductor performance and reliability. Experts contrast established methods with newer TOF-MS technology, detailing how faster, more sensitive approaches can expand detection capabilities beyond traditional gas and air sampling.

Key discussion topics include:

  • The role of TOF-MS in solid contamination and microdefect analysis.
  • Limitations and advantages of thermal desorption and GC-MS.
  • How evolving analytical approaches support next-gen device production.

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