Wasatch Photonics creates products that redefine the limits of compact spectroscopy. We're fascinated by the many ways light can be used to understand nature and solve the problems that touch our lives each day. Our products expand the boundaries of what diode-array spectrometers can do (not your budget)-delivering 10x more signal, lower limit of detection, and faster measurements in a compact footprint. Every aspect of our spectrometer designs has been optimized to maximize throughput and minimize noise, from low f/# inputs to near diffraction-limited transmissive optics and our own patented broadband, high efficiency gratings. Whether for research, field use, or OEM integration, we can develop a system perfectly tuned to your application.
Raman: Clearer, faster spectra at more excitation wavelengths than anywhere else: 405, 532, 638, 785, 830, & 1064 nm.
NIR: Superior sensitivity and SNR for rapid measurements, 900–2500 nm. Superb thermal stability and linear absorbance below 0.1 AU.
Fluorescence: Picomolar limit of detection for benchtop fluorimeter sensitivity in a fraction of the footprint.
VIS-NIR: High efficiency and low stray light from 400–1100 nm, ideal for low light applications, kinetics monitoring, and high-throughput quality control.
Full Configurability: All products offered as fiber coupled/free-space spectrometers or integrated systems; choice of slit size and detector cooling. Custom gratings available upon request for OEMs.
Wasatch Photonics' Durham, North Carolina, facility serves the spectroscopy and OCT markets, and is ISO 9001:2015 certified. Our patented and proprietary VPH gratings are developed and manufactured in Logan, Utah.
Wasatch Photonics
Systems Division
4022 Stirrup Creek Drive, Suite 311
Durham, NC 27703
TELEPHONE
(919) 544-7785
E-MAILinfo@wasatchphotonics.com
WEB SITEwasatchphotonics.com
NUMBER OF EMPLOYEES
80
YEAR FOUNDED
2002
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.