Here we conduct an evaluation of significant operational parameters of IR microscopy for accurately determining the size of microplastics, with the overarching goal of outlining performance parameters that will help in the standardization of microplastics analysis.
Measurements of the optical proper ties of a ceramic material, Z93, which is in current use on the International Space Station (ISS), reveal why this material is successful for thermal control in the ISS implementation, and also point to potential future material design improvements.
Spectroscopic ellipsometry, correlated with UV-vis-NIR spectroscopy, is used to determine the optical constants of thin films, such as in GexSb40-xSe60 chalcogenide glass.
