Si-Ware Systems' NeoSpectra™ business was established in 2015 and specializes in the design and manufacturing of Microelectromechanical Systems (MEMS) powered miniature Fourier Transform InfraRed (FT-IR) spectrometers, or spectral sensors. The first generation NeoSpectra sensors operate in wide spectral ranges in the Near InfraRed (NIR) region, enabling the analysis of various material properties with a single sensor. The sensors are constructed from low cost, robust, permanently aligned, and highly reproducible components. The core technology is based on semiconductor fabrication techniques promising unprecedented economies of scale. NeoSpectra sensors are the smallest and lowest cost spectral sensors enabling ubiquitous spectral sensing for all.
NeoSpectra sensors can be used in a wide variety of industries and markets including:
Si-Ware Systems is a fabless company with design and development headquartered in Cairo, Egypt. There are two subsidiary branches in Paris, France and Los Angeles, California. NeoSpectra sensors are manufactured through a top tier, world-wide supply chain and are available through sales representatives and distributors around the world.
Si-Ware Systems' NeoSpectra
3, Khaled Ibn Al-Waleed St. Sheraton, Heliopolis, Cairo, Egypt 11361
TELEPHONE
+20 222 68 47 04
E-MAILinfo@si-ware.com
WEB SITEwww.neospectra.com
NUMBER OF EMPLOYEES
153
YEAR FOUNDED
2015
USA: 3
Elsewhere: 150
Getting accurate IR spectra on monolayer of molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.
Achieving Accurate IR Spectra On Monolayer of Molecules
April 18th 2024Creating uniform and repeatable monolayers is incredibly important for both scientific pursuits as well as the manufacturing of products in semiconductor, biotechnology, and. other industries. However, measuring monolayers and functionalized surfaces directly is. difficult, and many rely on a variety of characterization techniques that when used together can provide some degree of confidence. By combining non-contact atomic force microscopy (AFM) and IR spectroscopy, IR PiFM provides sensitive and accurate analysis of sub-monolayer of molecules without the concern of tip-sample cross contamination. Dr. Sung Park, Molecular Vista, joined Spectroscopy to provide insights on how IR PiFM can acquire IR signature of monolayer films due to its unique implementation.