Webcasts: X-ray Techniques
Hybrid Wafer Metrology for Bump Inspection and Overlay Control in Semiconductor Device Manufacturing
November 14th 2022Monday, November 14th, 2022 at 11am EST|8am PST|6pm IST Join us for this web seminar to learn about advanced hybrid metrology to optimize semiconductor R&D and high-volume manufacturing processes, including bump inspection in thin-film analysis, and thickness and composition measurements of AgSn micro solder bumps using a monochromatic micro X-ray beam.
Unique Scientific Analysis to Authenticate Fine Art
September 20th 2022Tue, Sep 20, 2022 1:00 PM EDT Jackson Pollock is considered one of the preeminent artists of the 20th century and perhaps the most important US-born painter. The remnants of paint from Pollock’s artwork projects remain on the studio floor and are ripe for scientific analysis using portable and noninvasive spectroscopic techniques, such as Raman and X-ray fluorescence (XRF). It is almost certain that Pollock created paintings with pigments now present on the studio floor, which means they can be used as a reference to help determine the authenticity of any future unknown works.